Home Categories
CFPs Conf Series
My List
My Archive
On iPhone
On Android
posted by user: xgeorgio || 6107 views || tracked by 7 users: [display]

ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

FacebookTwitterLinkedInGoogle

Link: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2011/
 
When Oct 12, 2011 - Oct 14, 2011
Where San Francisco, USA
Submission Deadline Mar 15, 2011
Notification Due Apr 15, 2011
Final Version Due May 20, 2011
Categories    stress testing   reliability
 

Call For Papers

[Empty]

Related Resources

ICDAIIS 2027   1st International Conference on Data, AI & Intelligent Systems
IEEE ICVARS 2026   IEEE--2026 10th International Conference on Intelligent Computing and Virtual & Augmented Reality Simulations (ICVARS 2026)
AIChE Spring Meeting & GCPS 2026   2026 AIChE Spring Meeting & 22nd Global Congress on Process Safety
IEEE ICSRS 2026   IEEE--2026 The 10th International Conference on System Reliability and Safety (ICSRS 2026)
TC 2026   47th Translating and the Computer Conference
SRSE 2026   IEEE--2026 The 8th International Conference on System Reliability and Safety Engineering (SRSE 2026)
Disability & Gender 2026   CfP: The Politics of Ableism: Gender, Sexuality, and Disability in Literature and Media
QRS 2026   The 26th International Conference on Software Quality, Reliability, and Security
A Focus on Pedagogy 2026   Learning & Teaching Conference: A Focus on Pedagogy 2026
IJSC 2026   International Journal on Soft Computing - H-Index:26
About Us | Contact Us | Data | Privacy Policy | Terms and Conditions
Partners: AI2's Semantic Scholar
This wiki is licensed under a Creative Commons Attribution-Share Alike 3.0 License.