ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

posted by user: xgeorgio || 6246 views || tracked by 7 users: [display]

ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

Link: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2011/

When	Oct 12, 2011 - Oct 14, 2011
Where	San Francisco, USA
Submission Deadline	Mar 15, 2011
Notification Due	Apr 15, 2011
Final Version Due	May 20, 2011

Categories stress testing reliability

Call For Papers

[Empty]

Related Resources

TC 2026 47th Translating and the Computer Conference

IEEE ICSRS 2026 IEEE--2026 The 10th International Conference on System Reliability and Safety (ICSRS 2026)

AIChE Spring Meeting & GCPS 2026 2026 AIChE Spring Meeting & 22nd Global Congress on Process Safety

ICMFM 2027 Springer--2027 6th International Conference on Materials Engineering and Functional Materials (ICMFM 2027)

AIChE Spring & GCPS 2027 2027 AIChE Spring Meeting & 23rd Global Congress on Process Safety

Science & Religion Forum 2026 Foundations in Science and Religion: Boundaries of Theory & Practice

Science & Religion Forum 2026 Data, Laws & Evidence: Philosophy of Science in Dialogue with religious Thought

NLAIM 2026 3rd International Conference on NLP, Artificial Intelligence, Machine Learning and Applications

IJBISS 2026 International Journal of Business Information Systems Strategies

THz Communications, Sensing & Security 2026 The IEEE 3rd International Workshop on Terahertz Communications, Sensing, and Security (in conjunction with IEEE MILCOM 2026)