The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between the scientists and technologies of the Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic systems. The symposium aims at attracting scientists especially from countries around the Black Sea, the Baltic states and Central Asia. We cordially invite you to participate and submit your contribution(s) to EWDTS’11 which covers (but is not limited to) the following topics:

Analog, Mixed-Signal and RF Test
Analysis and Optimization
ATPG and High-Level TPG
Built-In Self Test
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design for Testability
Design Verification and Validation
EDA Tools for Design and Test
Embedded Software Performance
Failure Analysis, Defect and Fault
FPGA Test
HDL in test and test languages
High-level Synthesis
High-Performance Networks and Systems on a Chip
Low-power Design
Memory and Processor Test
Modeling & Fault Simulation
Network-on-Chip Design & Test
Modeling and Synthesis of Embedded Systems
Object-Oriented System Specification and Design
On-Line Test
Power Issues in Testing
Real Time Embedded Systems
Reliability of Digital Systems
Scan-Based Techniques
Self-Repair and Reconfigurable Architectures
Signal and Information Processing in Radio and Communication Engineering
System Level Modeling, Simulation & Test Generation
Using UML for Embedded System Specification

CAD Session:

CAD and EDA Tools, Methods and Algorithms
Design and Process Engineering
Logic, Schematic and System Synthesis
Place and Route
Thermal, Timing and Electrostatic Analysis of SoCs and Systems on Board
Wireless Systems Synthesis
Digital Satellite Television