ASTR 2007 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

posted by system || 2448 views || tracked by 1 users: [display]

ASTR 2007 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

Link: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2007

When	Oct 31, 2007 - Nov 2, 2007
Where	Greenbelt, MD
Abstract Registration Due	Apr 30, 2007
Submission Deadline	Sep 17, 2007

Categories manufacturing

Call For Papers

[Empty]

Related Resources

AIAS 2025 Symposium for AI Accelerated Science 2025

IEEE-AIEA 2025 2025 6th International Conference on Artificial Intelligence and Electromechanical Automation-IEEE Xplore/EI/Scopus

IEEE AIxVR 2026 8th International Conference on Artificial Intelligence & extended and Virtual Reality

IEEE ACIRS 2025 IEEE--2025 10th Asia-Pacific Conference on Intelligent Robot Systems (ACIRS 2025)

EnergyTech 2026 8th International Conference on Renewable Energy, Resources and Sustainable Technologies

EI/Scopus-ICBIT 2025 2025 2nd International Conference on Biomedicine and Intelligent Technology-EI/Scopus

Ei/Scopus-AI2A 2025 2025 5th International Conference on Artificial Intelligence, Automation and Algorithms (AI2A 2025)

EI/Scopus-ICPEET 2025 2025 4th International Conference on Power Electronics and Electrical Technology-EI/Scopus

GPPS-TC- 2025 GPPS Shanghai25 Technical Conference

HICSS 2026 Hawaii International Conference on System Sciences Mini Track: Advances in Software Resilience: New Frontiers in Testing, Verification, Compliance, and Fault-Tolerance Mechanisms