The IEEE Semiconductor Wafer Test Workshop (SW Test Workshop) is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.

Please contact Meredith Griffith with any questions regarding the conference registration 912-961-1833 or meredith@cemamerica.com.

Key Dates for SW Test 2008
* 02-Feb-2008: Abstract Submission for Podium and Poster Deadline
* 16-May-2008: Final Podium and Poster Presentation Deadline
* 08-Jun-2008: Start of Workshop
* 11-Jun-2008: End of Workshop