The areas of interest include (but are not limited to) the following topics.

•Analog Test
•ATE Hardware and Software
•Automatic Test Generation
•Board Test and Diagnosis
•Boundary Scan Test
•Built-In Self Test (BIST)
•Current-Based Test
•Defect-Based Test
•Delay and Performance Test
•Dependability
•Design for Test(ability) – DfT
•Design Verification and Validation
•Diagnosis and Debug
•Economics of Test
•Failure Analysis
•Fault Modeling and Simulation
•Fault Tolerance
•High-Speed I/0 Test
•Low-Power IC Test
•Memory Test and Repair
•MEMS Test
•Microprocessor Test
•Mixed-Signal Test
•Nanotechnology Test
•On-line Test
•Power Issues in Test
•Reliability
•RF Test
•Self-Repair
•Signal Integrity Test
•Stacked IC Test
•Standards in Test
•System Test
•System-in-Package (SiP) Test
•System-on-Chip (SoC) Test
•Soft Errors
•Test(ability) Synthesis
•Test of Reconfigurable Systems
•Test Quality
•Thermal Issues in Test
•Transient and Soft Errors
•Yield Analysis and Enhancement