WRTLT 2009 : IEEE Tenthl Workshop on Register Transfer Level and High Level Testing

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WRTLT 2009 : IEEE Tenthl Workshop on Register Transfer Level and High Level Testing

Link: http://conferences.cse.cuhk.edu.hk/wrtlt09/

When	Nov 27, 2009 - Nov 28, 2009
Where	Hong Kong, China
Submission Deadline	Aug 4, 2009
Notification Due	Sep 11, 2009
Final Version Due	Oct 10, 2009

Categories computer

Call For Papers

The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.

Key Dates

Submission: Aug.4th, 09
Acceptance: Sep.11th, 09
Camera R: Oct.10th, 09
Workshop: Nov.27th-28th, 09
WRTLT Topics 　

Areas of interest include but are not limited to:

- Functional fault modeling
- RTL ATPG
- Microprocessor testing
- RTL BIST
- Relationship between RTL and gate level testing
- Design verification
- High level test bench generation
- SoC testing
- High level approaches for testing
- RTL DFT

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