18th IEEE International On-Line Testing Symposium
Meliá Sitges Hotel, Sitges, Spain, June 27-29, 2012

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CALL FOR PAPERS

http://tima.imag.fr/conferences/iolts/

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and the 2012 edition is organized by the Universitat Politècnica de Catalunya, the University of Athens, and the TIMA Laboratory.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologiesRadiation effects
Design for reliability
Design for variability
On-line power monitoring and control
On-line current, temperature, etc, monitoring
Secure circuit design
Fault-based attacks and counter measures
Self-checking circuits and coding theory
On-line testing of analog and mixed signal circuits
On-line testing in automotive, railway, avionics, industry
On-line testing in the continuous operation of large systems
Field diagnosis, maintainability and reconfiguration
Fault-tolerant and fail-safe systems
Dependability evaluation
Dependable systems design
On-line and off-line built-in self-test
Synthesis of on-line testable circuits

Submissions:
The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, papers should be allowed six pages in the IEEE Proceedings of the Symposium.

Please observe the following key dates:
Submission deadline: March 5, 2012
Notification of acceptance: April 21, 2012
Camera-ready papers due: May 14, 2012

Papers must be submitted electronically

Submission Information
Dimitris Gizopoulos
University of Athens
Dept. of Informatics & Telecomm.
Athens, Greece
Tel: +30 210 7275145
dgizop@di.uoa.gr

Xavier Vera
Intel Barcelona Research Center
Intel Labs Barcelona
Barcelona, Spain
Tel: +34 938001020
xavier.vera@intel.com

General Information
Michael Nicolaidis
TIMA Laboratory
Grenoble, France
Tel: +33 (0) 4 76 57 46 96
michael.nicolaidis@imag.fr

Ramon Canal
Universitat Politècnica de Catalunya
Dept. of Computer Architecture
Barcelona, Catalonia
Tel: +34 93 40 54 034
rcanal@ac.upc.edu


About the location:
IOLTS 2012 will be held in Sitges. Sitges is located on the coast south of Barcelona. It is famous for the quality of the sea and the beauty of its beaches. The locals and visitors enjoy the unique character of its architecture: beautiful facades, art nouveau houses and a magnificent church all together in an entanglement of narrow streets and passages.

For all updated information concerning IOLTS 2012, please visit the IOLTS web site:

http://tima.imag.fr/conferences/iolts/