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ART 2018 : IEEE Transactions on Reliability Special Section on Adaptive Random Testing | |||||||||||||||
Link: http://paris.utdallas.edu/TRel-ART/ | |||||||||||||||
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Call For Papers | |||||||||||||||
BACKGROUND
With the wide spread of mobile applications, embedded software, data analytics, and cloud-based applications, the total cost of testing software applications is huge and increasing. Both the academia and industry are finding methods to alleviate the problem. A fundamental element in many software testing techniques is to employ the notion of randomness in test artifact generation or to apply the concept in the decision making process. In a standalone manner, the notion of randomness is realized as random testing, which is regarded as the most basic form of software testing technique. Owing to its generality and efficiency, and despite the wide range of findings on its effectiveness in detecting failures, random testing has found successful industrial applications in areas like fuzzing and stress tests to expose software vulnerability. On the other hand, the notion of test case diversity has been found empirically to be an important factor in exposing failures. A significant form of test case diversity is Adaptive Random Testing (ART), which combines the notions of randomness and test case diversity in generating test cases. It can improve the effectiveness of the random testing technique but incurs the time and memory costs of test case diversity techniques. Recent advances in ART research have produced new algorithms with linear time complexity. Further empirical studies on real-world applications have produced new insights, confirming that some of the ART algorithms are consistently more effective or consistently less effective than random testing. There has also been experimentation in replacing the notion of randomness in other testing techniques such as test case prioritization by novel forms of ART. Given this preamble, IEEE Transactions on Reliability will have a special section soliciting original work in Adaptive Random Testing that provides innovative theoretical contributions, comprehensive empirical validation, or novel applications. Submissions will be reviewed and selected based on originality, technical correctness, presentation, and practical relevance. TOPICS The topics of interest include, but are not limited to, the following: + Theoretical foundations of adaptive random testing + Time complexity analysis of adaptive random testing algorithms + Empirical study on adaptive random testing + Novel algorithms of adaptive random testing + Generalization of adaptive random testing + Parallelization of adaptive random test case generation + Novel frameworks, platforms, and kernel libraries of adaptive random testing + Applications of adaptive random testing to software engineering methodology and techniques + Adaptive random testing for and on security, deep learning, and big data applications + Novel interdisciplinary applications of adaptive random testing + Integration of measurement and prediction for adaptive random testing + Large-scale case studies, benchmark suites, and industrial applications and practices + Critical evaluation of adaptive random testing + Adaptive random testing beyond validation and verification SUBMISSION We welcome high quality submissions that are original work, not published, and not currently submitted elsewhere. We also encourage extensions to conference papers, unless prohibited by copyright, if there is a significant difference in the technical content. Improvements such as adding a new case study or including a description of additional related studies do not satisfy this requirement. The overlapping between each submission and other published articles, including the authors’ own papers, should be less than 30%. Each submission must conform to the two-column format of printed articles in the IEEE Transactions on Reliability with all figures and tables embedded in the paper, rather than listed at the end or in the appendix. More information on how to prepare and submit manuscripts can be found at http://rs.ieee.org/transactions-on-reliability.html. IMPORTANT DATES March 1, 2018 Paper submission deadline June 15, 2018 First round notification December 1, 2018 Final notification EDITOR-IN-CHIEF Professor W. Eric Wong, University of Texas at Dallas, USA GUEST EDITOR Professor W.K. Chan, City University of Hong Kong, Hong Kong GENERAL INQUIRES Send emails to wkchan@cityu.edu.hk. |
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