posted by organizer: pbilski || 4884 views || tracked by 4 users: [display]

IMEKO TC10 2014 : 13th IMEKO TC10 Workshop on Technical Diagnostics - Advanced measurement tools in technical diagnostics for systems' reliability and safety

FacebookTwitterLinkedInGoogle

Link: http://imekotc10-2014.org/
 
When Jun 26, 2014 - Jun 27, 2014
Where Warsaw, Poland
Submission Deadline Apr 21, 2014
Notification Due Apr 30, 2014
Final Version Due Jun 1, 2014
Categories    artificial intelligence   technical diagnostic   measurement   on-line monitoring
 

Call For Papers

INVITATION
The International Measurement Confederation IMEKO, Technical Committee 10 – Technical Diagnostics, is proud to invite you to attend the 13th IMEKO TC10 Workshop on Technical Diagnostics – “Advanced measurement tools in technical diagnostics for systems' reliability and safety” to be held in Warsaw, Poland, on June 26-27, 2014. The Workshop is a forum for exchanging knowledge and share ideas or solutions regarding methods, principles, instruments and tools, standards and industrial applications on Technical Diagnostics, including their diffusion across the scientific community. Participants will have the excellent opportunity to exchange scientific and technical experience with specialists from around the world and to start or expand their international co-operation.

CALL FOR PAPERS
Authors are kindly invited to submit extended summaries on the topics listed below, three to four pages length in A4 format. The abstract should report on original research results of theoretical or applied nature, explaining the significance of the contribution to the research field. The summaries will be reviewed by the International Program Committee. Electronic summaries must be in Adobe Acrobat (pdf) and should be sent according to the procedure described on the conference website: http://www.imekotc10‐2014.org.

SPECIAL ISSUE
The IMEKO TC10 Special Issue will contain selected papers on the basis of the results of regular peer review of the manuscripts submitted. The manuscript MUST be significantly extended beyond the scope of the proceedings paper. The selected papers will be published in the Measurement (Elsevier), Metrology and Measurement Systems and ACTA IMEKO journals.

TOPICS
• basic principles and development trends in technical diagnostics
• on-line condition monitoring and maintenance of industrial process, plants and complex systems
• advanced sensors, data acquisition systems and signal processing for diagnostic tasks
• technical identification and prediction models
• safety critical systems
• diagnostics for Maintainability, Safety, Risk assessment and management
• model-based diagnostics
• non-destructive testing
• artificial intelligence techniques and machine learning for diagnostics
• diagnostics applications in transportation, mechatronics, avionics, automotive and biomedical systems
• decision support and IT solutions for diagnosis
• diagnostics for the improvement of quality of life and environment
• standards of industrial systems and processes diagnostics
• industrial applications of monitoring and supervision systems

Related Resources

SPIE-ARAEML 2025   2025 2nd International Conference on Advanced Robotics, Automation Engineering and Machine Learning (ARAEML 2025)
Ei/Scopus-SGGEA 2025   2025 2nd Asia Conference on Smart Grid, Green Energy and Applications (SGGEA 2025)
GHCW 2025   The First International Conference on Digital AI Technologies for Global Health and Citizen Well-being
ICTAI 2025   IEEE 37th International Conference on Tools with Artificial Intelligence
ECTDM 2025   Emerging Concerns in Technical Debt Management
MLMI 2025   2025 The 8th International Conference on Machine Learning and Machine Intelligence (MLMI 2025)
SIGCSE 2026   57th ACM Technical Symposium on Computer Science Education
Ei/Scopus-IPCML 2025   2025 International Conference on Image Processing, Communications and Machine Learning (IPCML 2025)
ICACAR 2025   2025 4th International Conference on Advanced Control, Automation and Robotics
IEEE- CCRIS 2025   2025 IEEE 6th International Conference on Control, Robotics and Intelligent System (CCRIS 2025)