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IWSC 2010 : 4th INTERNATIONAL WORKSHOP ON SOFTWARE CLONESConference Series : International Workshop on Software Clones | |||||||||||||||
Link: http://iwsc2010.ist.osaka-u.ac.jp/ | |||||||||||||||
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Call For Papers | |||||||||||||||
Call for Papers (IWSC2010)
Fourth International Workshop on Software Clones - Exploring and Restructuring Systems through Clones - May 8, 2010 Cape Town, South Africa In conjunction with ICSE 2010 http://iwsc2010.ist.osaka-u.ac.jp Full/Position Papers Due: January 20, 2010 Software clones are identical or similar pieces of code or design. Clones are known to be closely related to various issues on software engineering, such as software quality, complexity, architecture, refactoring, evolution, licensing, plagiarism, and so on. Various characteristics of software systems can be uncovered through the clone analysis, and system restructuring can be performed by merging clones. The purpose of this workshop is to continue to solidify and give shape to this research area and community. More speci cally, the goals are to bring together researchers and practitioners from around the world to evaluate the current state of research and applications, discuss common problems, discover new opportunities for collaboration, exchange ideas, and envision new areas of research and applications. Topics of interest include, but are not limited to: - Definition of software (code) clones - Types, distribution, and nature of clones in software systems - Causes and e ects of clones - Techniques and algorithms for clone detection, analysis, and management - Clone and clone pattern visualization - Tools and systems for detecting and analysing software clones - Applications of clone analysis - Clone management - System architecture and clones - Effect of clones on system complexity and quality - Clone analysis in families of similar systems - Industrial experience - Measures of code similarity - Cost/economic and trade-o ff models for clone removal - Evaluation and benchmarking of clone detection methods - Evolution of clones - Licensing and plagiarism issues - Clone-aware software design and development - Refactoring through clone analysis - Raising the granularity/abstraction level of clone detection and analysis(high-level clones) We aim at full papers limited to 8 pages and position papers limited to 2 pages. Submissions must adhere to the ACM two-column proceedings format: http://www.acm.org/sigs/publications/proceedings-templates Papers must present novel ideas and open issues, or represent important viewpoints on the field. They must be relevant to the goals of the workshop and hold the potential for lively discussion. Papers will be reviewed by at least two members of the workshop program committee. Accepted research and position papers will be published in the workshop proceedings. Authors of selected papers will be invited to present their work during the workshop and/or act as discussion group leaders during workshop sessions. Submission Submissions should be uploaded online to the workshop's submission web site: http://www.easychair.org/conferences/?conf=iwsc2010 Important dates January 20, 2010: Position and full papers due February 15, 2010: Noti cation of acceptance February 25, 2010: Camera-ready copy due May 8, 2010: Workshop Organizing Committee Katsuro Inoue, Osaka University, Japan Stanislaw Jarzabek, National University of Singapore Rainer Koschke, University of Bremen, Germany James R. Cordy, Queen's University, Canada Program Committee Andrew Walenstein (University of Louisiana at Lafayette) Angela Lozano (Universite Catholique de Louvain) Chanchal K. Roy (University of Saskatchewan) Daniel M. German (University of Victoria) Giuliano Antoniol (Ecole Polytechnique de Montral) Ira Baxter (Semantic Designs, Inc.) James R. Cordy (Queen's University) Jens Krinke (King's College, London) Katsuro Inoue (Osaka University) Masafumi Katahira (Japan Aerospace Exploration Agency) Massimiliano Di Penta (University of Sannio) Michel Wermelinger (The Open University) Mike Godfrey (University of Waterloo) Miryung Kim (University of Texas at Austin) Rainer Koschke (University of Bremen) Stanislaw Jarzabek (National University of Singapore) Toshihiro Kamiya (AIST) Xing Zhenchang (National University of Singapore) Contact Information http://iwsc2010.ist.osaka-u.ac.jp iwsc2010@ist.osaka-u.ac.jp |
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