ESREF 2010, the 21st European Symposium on Reliability of Electron Devices will take place at the historical Monte Cassino Abbey and in Gaeta (Italy) from 11th to 15th October 2010.

This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

This event is organised by the University of Cassino (University of Cassino - Via G.Di Biasio 43 - 03043 CASSINO (FR) - ITALY) with the technical co-sponsorship of DAEIMI - Department of Automation, Electromagnetism, Information engineering and Industrial Mathematics (Univ. of Cassino), IEEE - Electron Devices Society, IEEE - Reliability Society, and ANADEF association (French association of industrial labs working in failure analysis).