The IEEE International Conference on Imaging Systems and Techniques will take place jointly with the IEEE International School on Imaging (ISI) in the beautiful island of Santorini, Greece, in October 14, 2014. The objectives of the IEEE International School of Imaging (ISI) is to explore physical, molecular, biochemical and engineering imaging
principles, aimed to the advancement and generation of new knowledge related to the design, development, and applications of imaging and spectroscopy technologies, medical diagnostics, analytical instrumentation and techniques. Engineers, scientists and medical professionals from Industry, Government, Academia, and Healthcare who want to bridge technology and clinical disciplines in the multidisciplinary areas of imaging, spectroscopy and medical diagnostic device industry, are invited to attend the IST Conference and interact with major worldwide experts, aimed at advancing the science of imaging, the development of visualization technologies. The scope of the IST is to increase the understanding of pathophysiology and metabolism and measure therapeutic efficacy; exploring multifaceted design principles and new applications of imaging that would lead ultimately to novel devices and technologies, standards and metrology, and systems with unsurpassed image quality, scalability, reconfigurability, and miniaturization capabilities.

The IST 2014 Conference and the International School of Imaging are two distinct events,
taking place consecutively, and both addressing the following four areas:

1. Clinical Diagnostics, Theranostics, and Translational Imaging: Medical diagnostics, translational theranostics, bioinformatics, neuroimaging, robotics, and surgical guidance imaging, molecular imaging and biology, etc.

2. Imaging Modalities and Techniques: cameras, microscopy and displays, polarimetry, multispectral imaging, immunohistochemical digital imaging, MRI, PET, SPECT, CT, ECT, etc.

3. Space Defense and Commercialization of Space: defense and space surveillance imaging technologies, remote sensing, ladars and lidars, multilayered imaging technologies, image processing and pattern recognition, etc.

4. Visualization, Inspection and Manufacturing: semiconductor wafers, nanomaterials and composites, biomaterial characterization, illumination architectures, automatic defect classification, etc.

For a full list of topics, see the complete CFP here: http://ist2014.ieee-ims.org/sites/ist2014.ieee-ims.org/files/call-for-papers/IST%202014%20Announcement.pdf

General Chair:
George Giakos, University of Akron, USA

For more information, contact the IST 2014 Administrator:
Cynda Covert
ccovert@conferencecatalysts.com